SAM - Scan Attendance Manager

2017年11月25日

Experience simpler navigation through a brand new user-interface and enjoy the following new features in version 4.0:
1. Attendance Types are now introduced to categorize each Attendance record.
2. Override the Class for which Attendance is captured during scanning.
3. Add a new Student during scanning.
4. Attendance Reports now allow custom report date filtering.
5. Attendance Charts are introduced with annual, monthly and top Attendance.